Keithley Automated Characterization Suite (ACS) Software
Keithley’s Automated Characterization Suite (ACS) is a flexible, interactive software test environment designed for device characterization, parametric test, reliability test, and even simple functional tests. ACS supports a wide array of Keithley instrumentation and systems, hardware configurations, and test settings, from a few bench-top instruments for use in a QA lab to fully integrated and automated rack-based test systems. With ACS, users are able to configure their instrumentation using the automated hardware management tool and perform tests quickly without the need for programming knowledge.
ACS Basic Edition Semiconductor Parametric Test Software for Component and Discrete Devices
Key Features
- Designed for packaged devices (MOSFETs, BJTs, IGBTs, diodes, resistors, etc.)
- Rich set of test libraries for fast and easy test setup and execution without programming
- Built-in data analysis tools for quick analysis of parametric dataSupports Keithley’s Series 2600B, Series 2400, and Series 2400 Touchscreen SourceMeter® Source Measure Unit (SMU) instruments and 2651A and 2657A System SourceMeter SMU instruments
- Simplified instrument configuration using the automated hardware management tool Windows 11 and 10 compatible
ACS Standard Edition Automated Characterization Suite Software
Key Features
- Supports the following test modules: GUI, Lua Script, Python and C
- Supports a wide array of instruments and probers to accommodate a broad range of applications
- Intuitive GUI simplifies I-V tests, analysis, and results from benchtop to fully automated parametric testers to enhance user experience
- Develop and execute tests at the device, sub-site, site, wafer, and cassette level for increased test capability
- Intuitive GUI for test plan development and interactive operation
- Interactive and real-time data plotting accelerates review of test results
- Highly portable test projects with minimal or no modifications
- Supports multiple groups of TSP® instruments for parallel testing to increase productivity
- Flexible, modular software accommodates evolving and mature test requirements
- Customizable for parameters extraction by special algorithms for added flexibility
- Customized data reporting and uploading (FTP, DB, etc.)
- Simplified instrument configuration using the automated hardware management tool
- Windows 11 and 10 compatible
ACS Wafer Level Reliability Edition
Key Features
- Leverages unique strengths of Keithley Series 2600B, Series 2400, and Series 2400 Touchscreen Source Measure Unit (SMU) instruments and 2651A and 2657A System SourceMeter SMU instruments – including system scalability and measurement speed
- System configurations from 2 to 44 channels
- Comprehensive JEDEC-compliant test suite
- Optimized for both emerging and mature technologies
- Supports both sequential and parallel testing
- Fully automatic single-site and multi-site capability
- Compatible with all popular wafer probe stations
- Real-time plotting and wafer mapping
- Simplified instrument configuration using the automated hardware management tool